In June of this year I had the opportunity to attend our DISTek-led Modeling and Simulation training course. Currently, I am the lead of the Automation and Test group here at DISTek, but in my previous roles I have been heavily involved in desktop application development, as well as test system development primarily using LabVIEW. My exposure to modeling and embedded has been somewhat limited thus far, so I thought it would be a good experience to learn some of the basics.
Another May and another NIWeek has come and gone. What did you miss this year if you weren’t able to attend? Maybe not as much as you think, at least if you’re interested in advanced technical sessions.
Acquiring and/or logging high speed data, using the traditional DAQmx scaling approach, will consume considerable amounts of memory due to its use of the double precision data type. Each sample collected will consume eight bytes of memory whether being stored in memory or on disk. This size is fine when collecting data at lower rates, but if you are collecting data at a rate of 1 MS/s, eight bytes per sample is too much for most systems to handle.
It’s been a crazy couple of weeks around the office. We’re moving what feels like a thousand miles a minute as we put the final touches on our presentation for CONEXPO-CON/AGG 2017. Yes, you read that right, the DISTek crew is headed to Las Vegas next week for THE international construction industry show. This year’s show is running March 7 – 11 at the Las Vegas Convention Center.
A customer has been receiving field failures and the root cause has been difficult to determine. They have ideas of what may be causing these failures and need a test system that can simulate the various conditions and monitor the Device Under Test (DUT) to assist in determining the root cause. The customer turned to DISTek to provide a bench-top setup that will control the DUT and measure multiple in-circuit test points for events that may be damaging field effect transistors (FET) along with recording FET case temperatures. Custom events have been defined by the customer and will trigger the system to capture pre and post-trigger data. The test system should also provide various loads to the output of the DUT.
Welcome back to the blog! Today, I will be talking about how to operate a Cognex smart camera via a LabVIEW program. The way I will be communicating with the camera is via TCP/IP. There are other potential ways to communicate with the camera from LabVIEW, but this was determined to be the best way, giving us the most control over the camera. I will walk through some basic terminology that is necessary to discuss building a Cognex vision test. Then, I will create and set up a vision test and finally, I will briefly describe how to program LabVIEW to send/receive information to the camera and to trigger an image acquisition.
As LCD vehicle displays have become more prevalent and versatile in both on- and off-highway, the time it takes to ensure proper display functionality after a software release has increased dramatically. It is not uncommon for displays to have 15, 20, or even 30 different screens, each of which having multiple sub-selections available. If you take into consideration different supported languages, the scope of the test grows dramatically. DISTek, as a company, is always attempting to define the future needs of customers in the off-highway industry, of which vehicle display testers are one of those needs.